Description: Research and technology standards containing links to other information sources. A collection of technical standards and select journals from ASTM (American Society for Testing and Materials) International
Description: Research database containing full text. Collection of content published by IEEE (Institute of Electrical and Electronics Engineers) which includes journals, conference proceedings, technical standards, books, and courses.
Contents: Scholarly (Peer Reviewed) Journal Articles; Conference Proceedings; Standards More info
Description: General research database from Thomson Reuters containing full text. Includes value-added patent information from Derwent World Patent Index as well as patent citation information from Patents Citation Index.